PRISA: a user-friendly software for determining refractive index, extinction co-efficient, dispersion energy, band gap, and thickness of semiconductor and dielectric thin films

A simple user-friendly software named PRISA has been developed to determine optical constants (refractive index and extinction co-efficient), dispersion parameters (oscillator energy energy), absorption co-efficient, band gap thickness of semiconductor dielectric thin films from their measured transmission spectrum, only. The thickness, refractive index, co-efficient the have derived using Envelope method proposed by Swanepoel. in strong region is calculated Connel Lewis. Subsequently, both direct indirect bandgap estimated spectrum Tauc plot. codes for are written Python graphical user interface programmed with tkinter package Python. It provides convenient input output data. a feature retrieve order check reliability. performance verified analyzing numerically generated spectra a-Si:H amorphous films, experimentally electron beam evaporated HfO2 as examples. found be much simpler accurate compared other freely available softwares. To help researchers working on made at https://www.shuvendujena.tk/download.